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Application: | Industrial |
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Vanta Element Model
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Vanta Element-S Model
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Use
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Affordable alloy ID
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Affordable light element detection
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Best for
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Basic analysis
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Analyzing Mg, Al, Si,S, and P
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Detector
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Silicon drift detector
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Faster silicon drift detector
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Window
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ThickKapton window
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Prolene window withKapton mesh support
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Excitation Source
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2-wattX-ray tube with35kVtungsten anode
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4-wattX-ray tube with50kVsilveranode
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ElementAdditionAvailable
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Yes
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Yes
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X-ray fluorescence spectroscopy (XRF) technology: When high-energy X-rays with energy higher than the binding energy of the inner electrons of an atom collide with an atom, an inner electron is expelled to form a hole, making the atomic system unstable. When the outer electron jumps to the hole, the Auger effect may occur, that is, the ejected photon is absorbed and another secondary photoelectron is expelled; or energy may be released in the form of photons, producing X-ray fluorescence. The energy or wavelength of fluorescence corresponds to the element one by one. The type of element can be determined by measuring the wavelength of fluorescent X-rays, and quantitative analysis of elements can be performed based on the intensity of fluorescent X-rays. The X-ray detector converts the optical signal into an electrical signal, which is then processed and analyzed to obtain the result.
Laser induced breakdown spectroscopy (LIBS) technology: A high-energy pulsed laser beam is emitted by a laser light source and focused on the sample surface, causing the sample material to instantly vaporize and form plasma. The excited atoms and ions in the plasma radiate characteristic spectral lines, which are collected by the spectrometer and decomposed and analyzed by the spectral detector to determine the elemental composition of the sample.